标题: SRAM test malfunction [打印本页] 作者: HotIce 时间: 2022-4-17 17:07 标题: SRAM test malfunction
I have several HM6264 chips, I choose the standard sram test 6264 and every time I get information that the chip is damaged and it is not possible that all these chips are damaged, is this function not working properly in T56?
